@@ -8,35 +8,19 @@ The basic measure of efficiency of a pairwise test generation tool is the number
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@@ -8,35 +8,19 @@ The basic measure of efficiency of a pairwise test generation tool is the number
Test generation efficiency is one aspect of a tool that a user will want to consider when choosing a tool to use, but numbers are easier to compare than less tangile aspects like "usability", so a standard set of benchmarks emerged over the years. The table below summarizes efficiencies for several tools that happened to publish their numbers.
Test generation efficiency is one aspect of a tool that a user will want to consider when choosing a tool to use, but numbers are easier to compare than less tangile aspects like "usability", so a standard set of benchmarks emerged over the years. The table below summarizes efficiencies for several tools that happened to publish their numbers.
| 1 | AETG | 9 | 15 | 41 | 28 | 10 | 180 | Y. Lei and K. C. Tai [In-parameter-order: a test generation strategy for pairwise testing](http://www-cse.uta.edu/~ylei/paper/hase.pdf), p. 8. |
| 2 | IPO | 9 | 17 | 34 | 26 | 15 | 212 |
| 2 | IPO | 9 | 17 | 34 | 26 | 15 | 212 | K. C. Tai and Y. Lei [A Test Generation Strategy for Pairwise Testing](http://ranger.uta.edu/~ylei/paper/ipo-tse.pdf) p. 2. |
| 3 | TConfig | 9 | 15 | 40 | 30 | 14 | 231 |
| 3 | TConfig | 9 | 15 | 40 | 30 | 14 | 231 | A. W. Williams [Determination of Test Configurations for Pair-wise Interaction Coverage](http://www.site.uottawa.ca/~awilliam/papers/Testcom2000.pdf), p. 15. |
| 4 | CTS | 9 | 15 | 39 | 29 | 10 | 210 |
| 4 | CTS | 9 | 15 | 39 | 29 | 10 | 210 | A. Hartman and L. Raskin [Problems and Algorithms for Covering Arrays](http://www.haifa.il.ibm.com/projects/verification/mdt/papers/AlgorithmsForCoveringArraysPublication191203.pdf), p. 11. |
| 7 | DDA | ? | 18 | 35 | 27 | 15 | 201 | C. J. Colbourn, M. B. Cohen, R. C. Turban [A Deterministic Density Algorithm for Pairwise Interaction Coverage](http://www.public.asu.edu/~rturban/dda.pdf), p. 6. |
| 10 | EXACT | 9 | 15 | ? | 21 | 10 | ? | J. Yan, J. Zhang [Backtracking Algorithms and Search Heuristics to Generate Test Suites for Combinatorial Testing](http://doi.ieeecomputersociety.org/10.1109/COMPSAC.2006.33), p. 8. |
| 11 | IPO-s | 9 | 17 | 32 | 23 | 10 | 220 |
| 11 | IPO-s | 9 | 17 | 32 | 23 | 10 | 220 | A. Calvagna, A. Gargantini [IPO-s: Incremental Generation of Combinatorial Interaction Test Data Based on Symmetries of Covering Arrays](http://www2.computer.org/portal/web/csdl/doi/10.1109/ICSTW.2009.7), p. 17. |
1. Y. Lei and K. C. Tai [In-parameter-order: a test generation strategy for pairwise testing](http://www-cse.uta.edu/~ylei/paper/hase.pdf), p. 8.
2. K. C. Tai and Y. Lei [A Test Generation Strategy for Pairwise Testing](http://ranger.uta.edu/~ylei/paper/ipo-tse.pdf) p. 2.
3. A. W. Williams [Determination of Test Configurations for Pair-wise Interaction Coverage](http://www.site.uottawa.ca/~awilliam/papers/Testcom2000.pdf), p. 15.
4. A. Hartman and L. Raskin [Problems and Algorithms for Covering Arrays](http://www.haifa.il.ibm.com/projects/verification/mdt/papers/AlgorithmsForCoveringArraysPublication191203.pdf), p. 11.
5. Supplied by Bob Jenkins.
6. Supplied by George Sherwood.
7. C. J. Colbourn, M. B. Cohen, R. C. Turban [A Deterministic Density Algorithm for Pairwise Interaction Coverage](http://www.public.asu.edu/~rturban/dda.pdf), p. 6.
8. Supplied by Bob Jenkins.
9. Supplied by Jacek Czerwonka.
10. J. Yan, J. Zhang [Backtracking Algorithms and Search Heuristics to Generate Test Suites for Combinatorial Testing](http://doi.ieeecomputersociety.org/10.1109/COMPSAC.2006.33), p. 8.
11. A. Calvagna, A. Gargantini [IPO-s: Incremental Generation of Combinatorial Interaction Test Data Based on Symmetries of Covering Arrays](http://www2.computer.org/portal/web/csdl/doi/10.1109/ICSTW.2009.7), p. 17.
12. Supplied by Patryk Chamuczynski.
13. Supplied by Hiroshi Ukai [link](https://github.com/dakusui/jcunit/blob/0.8.x-develop/src/test/java/com/github/dakusui/jcunit8/experiments/StandardFactorSpaces.java).
